• DocumentCode
    1515756
  • Title

    Time-Dependent Many-Particle Simulation for Resonant Tunneling Diodes: Interpretation of an Analytical Small-Signal Equivalent Circuit

  • Author

    Traversa, Fabio Lorenzo ; Buccafurri, Emanuela ; Alarcón, Alfonso ; Albareda, Guillermo ; Clerc, Raphaël ; Calmon, Francis ; Poncet, Alain ; Oriols, Xavier

  • Author_Institution
    Dept. of Electron. Eng., Univ. Autonoma de Barcelona, Barcelona, Spain
  • Volume
    58
  • Issue
    7
  • fYear
    2011
  • fDate
    7/1/2011 12:00:00 AM
  • Firstpage
    2104
  • Lastpage
    2112
  • Abstract
    A full many-particle (beyond the mean-field approximation) electron quantum-transport simulator, which is named BITLLES, is used to analyze the transient current response of resonant tunneling diodes (RTDs). The simulations have been used to test an analytical (free-fitting parameters) small-signal equivalent circuit for RTDs under stable direct-current-biased conditions. The comparison provides an excellent agreement and furnishes a way to physically interpret each circuit element. In addition, a nonlinear novel RTD behavior in the negative differential conductance region has been established, i.e. asymmetric time constants in the RTD current response when high-low or low-high voltage steps are considered.
  • Keywords
    Monte Carlo methods; circuit simulation; equivalent circuits; resonant tunnelling diodes; transient response; BITLLES; Monte Carlo methods; analytical small-signal equivalent circuit; full many-particle electron quantum-transport simulator; negative differential conductance region; nonlinear novel RTD behavior; resonant tunneling diodes; stable direct-current-biased conditions; time-dependent many-particle simulation; transient current response; Analytical models; Approximation methods; Cutoff frequency; Electric potential; Quantum capacitance; Equivalent circuits; Monte Carlo methods; numerical simulation; resonant tunneling devices;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2138144
  • Filename
    5766729