Title :
Estimation of surface roughness parameters from dual-frequency measurements of radar backscattering coefficients
Author :
Mo, Tsan ; Wang, James R. ; Schmugge, Thomas J.
Author_Institution :
Comput. Sci. Corp., Beltsville, MD, USA
fDate :
9/1/1988 12:00:00 AM
Abstract :
A simple model was developed for estimating the surface roughness parameters of a bare soil field. The model uses a set of dual-frequency measurements of the field´s radar backscattering coefficients, which can be matched to calculated results obtained with assumed values for the surface roughness parameters, as represented by the surface height standard deviation σ and its correlation lengths. Scatter plots of measured and calculated radar backscattering coefficients at the C -band (4.25-GHz) frequency versus those at L-band (1.5 GHz) show that it is feasible to estimate the surface roughness parameters using this technique. The estimated values for σ are in excellent agreement with those of measurements. However, there are discrepancies between the estimated and measured values for the correlation length L. For a very rough field, the geometrical optics model could be more appropriate for modeling the C-band data
Keywords :
agriculture; geophysical techniques; radar applications; radiowave propagation; remote sensing; soil; 1.5 GHz; 4.25 GHz; C-band; L-band; SHF; UHF; agriculture; bare soil field; dual-frequency; land surface; microwave; radar backscattering coefficients; radar technique; remote sensing; surface roughness parameters; Backscatter; Frequency estimation; Length measurement; Measurement standards; Radar measurements; Radar scattering; Rough surfaces; Soil measurements; Solid modeling; Surface roughness;
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on