Title :
Fast modeling of core switching noise on distributed LRC power grid in ULSI circuits
Author :
Zheng, Li-Rong ; Tenhunen, Hannu
Author_Institution :
Dept. of Electron., R. Inst. of Technol., Stockholm, Sweden
fDate :
8/1/2001 12:00:00 AM
Abstract :
As technology scales, power supply noise caused by core logic switching becomes critical. Shorter signal rise edge, high integration density, and necessity of using on-chip decoupling capacitors require that the on-chip power distribution should be modeled as an LRC transmission line network with millions of switching devices. In this paper, we propose a sophisticated power grid model consisting of distributed LRC elements excited by constant voltage sources and switching capacitors. Based on this, fast equations for core switching noise estimations were formulated. Full-chip noise distribution on the power grid with any topology was efficiently and accurately computed. SPICE simulations confirmed its efficiency and accuracy. Experimental results obtained on our benchmark circuits revealed that the proposed technique speeded up simulations by several orders of magnitude compared with SPICE, whereas typical relative error was between 0±5%. By integrating a packaging model, the new model predicts accurately the upper boundaries of noise level for power bounce, ground bounce, and differential-mode power noise. Meanwhile, locations of hot spots in the power network are precisely identified. The model is suitable for full-chip rapid simulations for on-chip power distribution design in advanced ultra large scale integration (ULSI) circuits, particularly for early stage analysis, in which global and local optimization such as topology selection, power bus sizing, and on-chip decoupling capacitor placement can be easily conducted
Keywords :
SPICE; ULSI; circuit optimisation; circuit simulation; integrated circuit design; integrated circuit noise; integrated circuit packaging; power supply circuits; switching circuits; LRC transmission line network; SPICE simulations; ULSI circuits; constant voltage sources; core switching noise; decoupling capacitor placement; differential-mode power noise; distributed LRC power grid; full-chip noise distribution; global optimization; ground bounce; integration density; local optimization; on-chip decoupling capacitors; on-chip power distribution design; packaging model; power bounce; power bus sizing; power supply noise; signal rise edge; switching capacitors; topology selection; upper boundaries; Capacitors; Circuit noise; Circuit simulation; Circuit topology; Computational modeling; Network topology; Network-on-a-chip; Power distribution; Power grids; SPICE;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/6040.938290