Title :
Eddy-Current Nondestructive Testing Using an Improved GMR Magnetometer and a Single Wire as Inducer: A FEM Performance Analysis
Author :
Hamia, Rimond ; Cordier, Christophe ; Saez, Sébastien ; Dolabdjian, Christophe
Author_Institution :
ENSICAEN, Univ. of Caen, Caen, France
Abstract :
This paper describes an efficient nondestructive evaluation (NDE) eddy-current (EC) system using an improved giant magnetoresistance magnetometer (IGMRM) and a simple single wire as inducer. A three-dimensional finite-element method (3-D FEM) was implemented to evaluate the theoretical expected response of the system. The model was based on a modified magnetic vector potential and a reduced magnetic scalar potential, in conducting and nonconducting regions, respectively. The model robustness is established by comparing numerical and experimental results on a given benchmark aluminum plate sample. This efficient 3-D FEM model helps to understand the system performances. Moreover, the excitation frequency effect on the sensed signal is analyzed versus the benchmark sample thickness and the crack sizes. Results are also given and discussed in terms of signal-to-noise ratio.
Keywords :
aluminium; benchmark testing; crack detection; eddy current testing; finite element analysis; giant magnetoresistance; magnetometers; plates (structures); 3D finite element method; Al; FEM performance analysis; GMR Magnetometer; IGMRM; aluminum plate sample; benchmark sample thickness; crack sizes; eddy-current nondestructive testing; excitation frequency effect; improved giant magnetoresistance magnetometer; model robustness; modified magnetic vector potential; reduced magnetic scalar potential; signal-noise ratio; single wire inducer; theoretical expected response; Aluminum; Eddy current testing; Eddy currents; Finite element methods; Frequency; Magnetometers; Performance analysis; Robustness; Signal to noise ratio; Wire; Crack detection; GMR; eddy current; finite-element method; magnetometer; nondestructive testing;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2010.2052827