DocumentCode
1516166
Title
A wide dynamic range receiver channel for a pulsed time-of-flight laser radar
Author
Ruotsalainen, Tarmo ; Palojärvi, Pasi ; Kostamovaara, Juha
Author_Institution
Electron. Lab., Oulu Univ., Finland
Volume
36
Issue
8
fYear
2001
fDate
8/1/2001 12:00:00 AM
Firstpage
1228
Lastpage
1238
Abstract
An integrated receiver channel for a pulsed time-of-flight (TOF) laser rangefinder has been designed and tested. The bandwidth of the receiver channel is 170 MHz, the transimpedance can be controlled in the range from 1.1 kΩ to 260 kΩ, and the input-referred noise is ~6 pA/√Hz. The distance measurement accuracy is ±4.7 mm (average of 10000 measurements), taking into account walk error (input signal amplitude varies in the range 1:624) and jitter. A considerable increase in the input dynamic range of the receiver has been achieved by placing an integrated current buffer with variable attenuation between the external photodetector and the transimpedance preamplifier. Integrated electronic gain control structures together with the small size and low power consumption achieved by the use of full custom integrated technology considerably simplifies rangefinding devices for many applications. The circuit was implemented in an 0.8-μm BiCMOS process
Keywords
BiCMOS analogue integrated circuits; attenuators; comparators (circuits); gain control; integrated optoelectronics; laser ranging; operational amplifiers; optical radar; optical receivers; peak detectors; timing jitter; 170 MHz; BiCMOS process; comparator; controlled transimpedance; distance measurement accuracy; electronic gain control structures; external photodetector; input-referred noise; integrated current buffer; integrated receiver channel; jitter; laser rangefinder; low power consumption; peak detector; pulsed time-of-flight laser radar; small size; timing discrimination; transimpedance preamplifier; variable attenuation; walk error; wide dynamic range receiver channel; Attenuation; Bandwidth; Distance measurement; Dynamic range; Jitter; Laser noise; Optical design; Optical pulses; Photodetectors; Testing;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.938373
Filename
938373
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