DocumentCode
1516178
Title
A Space Reuse Strategy for Flash Translation Layers in SLC NAND Flash Memory Storage Systems
Author
Liu, Duo ; Wang, Yi ; Qin, Zhiwei ; Shao, Zili ; Guan, Yong
Author_Institution
Dept. of Comput., Hong Kong Polytech. Univ., Kowloon, China
Volume
20
Issue
6
fYear
2012
fDate
6/1/2012 12:00:00 AM
Firstpage
1094
Lastpage
1107
Abstract
This paper presents a space reuse strategy for flash translation layers in SLC nand flash storage systems. The basic idea is to prevent a block with many free pages from being erased in a merge operation. The preserved blocks are further reused as replacement blocks. In such a way, the space utilization and the number of erase counts of each block in a nand flash are enhanced. By employing the reuse strategy, we propose a reuse-aware flash translation layer (FTL) called reuse-aware NFTL (RNFTL) to improve the endurance and space utilization of single level cell (SLC) nand flash. We provide the performance analysis of RNFTL for frequent update operations and sequential write operations, and theoretically compare RNFTL with representative FTL schemes. We also discuss the opportunity to apply the reuse strategy in log-block-based FTL schemes. To the best of our knowledge, this is the first work to employ a space reuse strategy in FTLs to improve the space utilization and endurance of nand flash. The experiments have been conducted on a set of traces collected from real workload in daily life. The results show that the space reuse strategy can effectively improve space utilization, block lifetime and wear-leveling compared with the previous work.
Keywords
flash memories; SLC NAND flash memory storage system; flash translation layers; replacement block; reuse-aware NFTL; reuse-aware flash translation layer; sequential write operation; single level cell nand flash; space reuse strategy; space utilization; wear-leveling; Ash; Error correction codes; Flash memory; Memory management; Performance gain; Very large scale integration; Endurance; flash memory; flash translation layer; reuse; space utilization;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2011.2142015
Filename
5766800
Link To Document