Title :
Conditional-capture flip-flop for statistical power reduction
Author :
Kong, Bai-Sun ; Kim, Sam-Soo ; Jun, Young-Hyun
Author_Institution :
Sch. of Electron. Telecommun. & Comput. Eng., Hankuk Aviation Univ., Kyunggi, South Korea
fDate :
8/1/2001 12:00:00 AM
Abstract :
This paper describes a family of novel low-power flip-flops, collectively called conditional-capture flip-flops (CCFFs). They achieve statistical power reduction by eliminating redundant transitions of internal nodes. These flip-flops also have negative setup time and thus provide small data-to-output latency and attribute of soft-clock edge for overcoming clock skew-related cycle time loss. The simulation comparison indicates that the proposed differential flip-flop achieves power savings of up to 61% with no impact on latency while the single-ended structure provides the maximum power savings of around 67%, as compared to conventional flip-flops. With a typical switching activity of 0.33, the power consumption is reduced by as much as 23-30% with comparable minimum data-to-output latency. It is also indicated that the proposed single-ended structure provides power comparable to the fully static master-slave design with significantly reduced data-to-output latency. An eight-bit counter was fabricated using a 0.35-μm CMOS technology, and the experimental results indicate that the counter using the differential CCFF saves the overall power consumption by about 30% as compared to that using the conventional flip-flop
Keywords :
CMOS logic circuits; flip-flops; low-power electronics; CMOS technology; clock skew-related cycle time loss; conditional-capture flip-flop; differential flip-flop; internal nodes; low-power flip-flops; master-slave latches; negative setup time; redundant transitions elimination; single-ended structure; small data-to-output latency; soft-clock edge attribute; statistical power reduction; Clocks; Counting circuits; Delay; Digital systems; Energy consumption; Flip-flops; Frequency; Latches; Logic; Timing;
Journal_Title :
Solid-State Circuits, IEEE Journal of