• DocumentCode
    1516194
  • Title

    Split-level precharge differential logic: a new type of high-speed charge-recycling differential logic

  • Author

    Lee, Jungho ; Park, Joonbae ; Song, ByungJoon ; Kim, Wonchan

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
  • Volume
    36
  • Issue
    8
  • fYear
    2001
  • fDate
    8/1/2001 12:00:00 AM
  • Firstpage
    1276
  • Lastpage
    1280
  • Abstract
    In this paper, a new charge-recycling differential logic named split-level precharge differential logic (SPDL) is presented. It employs a new push-pull type output driver which is simple and separated from the NMOS logic tree. Therefore, it can improve energy efficiency, driving capability, and reliability compared with the previous differential logic structures which use cross-coupled inverters as the output driver. To verify the reliability and the applicability of the proposed SPDL in VLSI systems, an 8-bit full adder is fabricated in a 0.6-μm CMOS technology. Experimental results show that the performance of the SPDL is about two times as good as that of the previous half-rail differential logic (HRDL) in terms of power-delay product. Moreover, the SPDL has stable operation under mismatch or parameter variation
  • Keywords
    CMOS logic circuits; SPICE; VLSI; adders; driver circuits; high-speed integrated circuits; integrated circuit reliability; logic simulation; low-power electronics; 0.6 micron; 8 bit; CMOS technology; HSPICE; NMOS logic tree; VLSI systems; complementary logic tree; cross-coupled inverter; driving capability; energy efficiency; full adder; high-speed charge-recycling differential logic; low power; power-delay product; push-pull type output driver; reliability; split-level precharge differential logic; CMOS logic circuits; CMOS technology; Clocks; Driver circuits; Energy consumption; Energy efficiency; Logic devices; MOS devices; Pulse inverters; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.938378
  • Filename
    938378