DocumentCode :
1516240
Title :
Conference Reports
Volume :
28
Issue :
3
fYear :
2011
Firstpage :
82
Lastpage :
83
Abstract :
Conference Reports features the second IEEE International Workshop on Reliability Aware System Design and Test (RASDAT),which was held in conjunction with the 24th International Conference on VLSI Design.
Keywords :
RASDAT; design and test;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2011.57
Filename :
5766813
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1516240
