DocumentCode
1516245
Title
Panel Summaries
Volume
28
Issue
3
fYear
2011
Firstpage
84
Lastpage
85
Abstract
Panel Summaries reports on two ITC 2010 panels: "Concurrent Test Supported by DFT Techniques" and "ATE Companies and How Smart Does Our Silicon Need To Be?".
Keywords
ATE; DFT; ITC 2010; ITC panels; design and test;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2011.64
Filename
5766814
Link To Document