DocumentCode :
1516245
Title :
Panel Summaries
Volume :
28
Issue :
3
fYear :
2011
Firstpage :
84
Lastpage :
85
Abstract :
Panel Summaries reports on two ITC 2010 panels: "Concurrent Test Supported by DFT Techniques" and "ATE Companies and How Smart Does Our Silicon Need To Be?".
Keywords :
ATE; DFT; ITC 2010; ITC panels; design and test;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2011.64
Filename :
5766814
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1516245
