DocumentCode :
1516345
Title :
Semiconductor material and device characterization [Book Review]
Author :
Hagouel, P.
Author_Institution :
Thessaloniki, Greece
Volume :
15
Issue :
3
fYear :
1999
fDate :
5/1/1999 12:00:00 AM
Firstpage :
36
Lastpage :
36
Keywords :
Animals; Book reviews; Cameras; Charge carrier processes; Conductors; Contact resistance; Physics; Production; Semiconductor devices; Semiconductor materials;
fLanguage :
English
Journal_Title :
Circuits and Devices Magazine, IEEE
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/MCD.1999.768560
Filename :
768560
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1516345
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