Title :
On the Spreading Resistance of Thin-Film Contacts
Author :
Zhang, Peng ; Lau, Y.Y. ; Timsit, Roland S.
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fDate :
7/1/2012 12:00:00 AM
Abstract :
The spreading resistance of a microscopic area of contact (the “-spot”) located in a thin film is studied for both Cartesian and cylindrical geometries. The effect of film thickness on the spreading resistance is evaluated over a large range of aspect ratios. In the limit , the normalized thin-film spreading resistance converges to the finite values, i.e., 2.77 for the Cartesian case and 0.28 for the cylindrical case. An interpretation of these limits is given. Extension to a general α-spot geometry is proposed.
Keywords :
contact resistance; electrical contacts; thin films; wetting; α-spot geometry; Cartesian geometry; aspect ratios; contact microscopic area; cylindrical geometry; film thickness effect; normalized thin-film spreading resistance; thin-film contacts; Conductivity; Conformal mapping; Contact resistance; Geometry; Resistance; Solids; Constriction resistance; contact resistance; electrical contacts; skin depth; spreading resistance; thin films;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2012.2195317
