Title :
All Digital Linear Voltage Regulator for Super- to Near-Threshold Operation
Author :
Hsieh, Wei-Chih ; Hwang, Wei
Author_Institution :
Dept. of Electron. Eng. & Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fDate :
6/1/2012 12:00:00 AM
Abstract :
In this paper, an all digital push-pull linear voltage regulator is proposed that consists of a digital error detector, a voltage divider, a mode indicator, a pull device, and grouped push devices. The digital regulator is suitable for super- to near-threshold region operation by providing a variable output voltage that ranges from 0.5 to 1 V in steps of 0.1 V. The maximum load current is 100 mA for every output level. The current efficiency is 99.8% with only 164.5 μ A quiescent current on UMC 65-nm standard CMOS technology. A response time constraint is developed to provide a design guideline for (all) the digital control system. It describes the correlation between required speed of the digital control system, the output performance and the size of the decoupling capacitor. A time interleaving control technique is then proposed to have a tradeoff between output performance, quiescent current, and the size of decoupling capacitor.
Keywords :
CMOS integrated circuits; capacitors; digital control; voltage dividers; voltage regulators; CMOS technology; all digital push-pull linear voltage regulator; current 100 mA; current 164.5 muA; current efficiency; decoupling capacitor; design guideline; digital control system; digital error detector; efficiency 99.8 percent; grouped push devices; mode indicator; pull device; quiescent current; response time constraint; size 65 nm; super-to near-threshold region operation; time interleaving control technique; voltage 0.5 V to 1 V; voltage divider; Capacitors; Delay; Delay lines; Driver circuits; Regulators; Time factors; Voltage control; Current efficiency; digital; linear regulator; push-pull; response time constraint; time interleaving;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2011.2143438