DocumentCode
1517190
Title
Phase mapping of optical fields in integrated optical waveguide structures
Author
Balistreri, M.L.M. ; Korterik, J.P. ; Kiupers, L. ; van Hulst, N.F.
Author_Institution
Dept. of Appl. Phys., Twente Univ., Enschede, Netherlands
Volume
19
Issue
8
fYear
2001
fDate
8/1/2001 12:00:00 AM
Firstpage
1169
Lastpage
1176
Abstract
The phase evolution of optical waves in a waveguide structure has been studied with a heterodyne interferometric photon scanning tunneling microscope. Both phase and amplitude of the local optical field are measured with subwavelength resolution. Topographical maps of the waveguide surface are obtained simultaneously with the optical information. Unexpected phase patterns, with phase jumps and phase singularities, have been observed. The phase patterns can be fully understood by taking into account the total field that is the sum of the optical fields of the various modes. We show that with the unique spatial phase information, the relative field profiles and wave vectors of all the excited modes in a multimodal waveguide structure can be determined independently
Keywords
Mach-Zehnder interferometers; heterodyne detection; light interferometry; near-field scanning optical microscopy; optical planar waveguides; optical testing; scanning tunnelling microscopy; excited modes; heterodyne interferometric photon scanning tunneling microscope; integrated optical waveguide structures; local optical field; multimodal waveguide structure; optical fields; optical information; optical waves; phase evolution; phase jumps; phase mapping; phase patterns; phase singularities; relative field profiles; spatial phase information; subwavelength resolution; topographical maps; total field; unexpected phase patterns; wave vectors; waveguide structure; waveguide surface; Integrated optics; Optical interferometry; Optical microscopy; Optical mixing; Optical surface waves; Optical waveguides; Phase measurement; Surface topography; Surface waves; Tunneling;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/50.939798
Filename
939798
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