• DocumentCode
    1517190
  • Title

    Phase mapping of optical fields in integrated optical waveguide structures

  • Author

    Balistreri, M.L.M. ; Korterik, J.P. ; Kiupers, L. ; van Hulst, N.F.

  • Author_Institution
    Dept. of Appl. Phys., Twente Univ., Enschede, Netherlands
  • Volume
    19
  • Issue
    8
  • fYear
    2001
  • fDate
    8/1/2001 12:00:00 AM
  • Firstpage
    1169
  • Lastpage
    1176
  • Abstract
    The phase evolution of optical waves in a waveguide structure has been studied with a heterodyne interferometric photon scanning tunneling microscope. Both phase and amplitude of the local optical field are measured with subwavelength resolution. Topographical maps of the waveguide surface are obtained simultaneously with the optical information. Unexpected phase patterns, with phase jumps and phase singularities, have been observed. The phase patterns can be fully understood by taking into account the total field that is the sum of the optical fields of the various modes. We show that with the unique spatial phase information, the relative field profiles and wave vectors of all the excited modes in a multimodal waveguide structure can be determined independently
  • Keywords
    Mach-Zehnder interferometers; heterodyne detection; light interferometry; near-field scanning optical microscopy; optical planar waveguides; optical testing; scanning tunnelling microscopy; excited modes; heterodyne interferometric photon scanning tunneling microscope; integrated optical waveguide structures; local optical field; multimodal waveguide structure; optical fields; optical information; optical waves; phase evolution; phase jumps; phase mapping; phase patterns; phase singularities; relative field profiles; spatial phase information; subwavelength resolution; topographical maps; total field; unexpected phase patterns; wave vectors; waveguide structure; waveguide surface; Integrated optics; Optical interferometry; Optical microscopy; Optical mixing; Optical surface waves; Optical waveguides; Phase measurement; Surface topography; Surface waves; Tunneling;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.939798
  • Filename
    939798