DocumentCode
1517307
Title
Easy Process and Performance Improvement for Top-Emission Organic Light-Emitting Diodes by Using UV Glue as the Insulation Layer on Copper Substrate
Author
Tsai, Yu-Sheng ; Wang, Shun-Hsi ; Juang, Fuh-Shyang ; Chang, Shu-Wei ; Chen, Chuan-hung ; Chung, Ming-Hua ; Hsieh, Tsung-Eong ; Liu, Mark-O ; Liao, Teh-Chao
Author_Institution
Inst. of Electro-Opt. & Mater. Sci., Nat. Formosa Univ., Huwei, Taiwan
Volume
6
Issue
7
fYear
2010
fDate
7/1/2010 12:00:00 AM
Firstpage
279
Lastpage
283
Abstract
A high heat dissipation material (copper, Cu) was employed as the substrate for top emission organic light-emitting diodes (TEOLEDs). The UV glue was spin-coated onto the Cu substrate as the insulation layer to effectively improve Cu surface roughness and reduce process complexity. From the optoelectronic results, the optimized device with the Cu substrate shows the maximum luminance of 14110 cd/m2 and luminance efficiency of 7.14 cd/A. The surface and junction temperatures are measured to discuss the heat-dissipating effect on device performance. From the results, TEOLED fabricated on a Cu substrate has lower junction (55.34°C) and surface (25.7°C) temperatures, with the lifetime extended seven times. We employed Cu foil as the substrate for flexible TEOLED with maximum luminance of 10310 cd/m2 and luminance efficiency of 7.3 cd/A obtained.
Keywords
brightness; cooling; organic light emitting diodes; ultraviolet spectra; copper substrate; high heat dissipation material; insulation layer; luminance efficiency; maximum luminance; performance improvement; top-emission organic light-emitting diodes; uv glue; Chemical industry; Chemical technology; Copper; Insulation; Light emitting diodes; Materials science and technology; Organic light emitting diodes; Rough surfaces; Substrates; Surface roughness; Heat dissipation; UV glue; junction temperature; lifetime; luminance efficiency; organic light-emitting diode (OLED);
fLanguage
English
Journal_Title
Display Technology, Journal of
Publisher
ieee
ISSN
1551-319X
Type
jour
DOI
10.1109/JDT.2010.2048300
Filename
5485048
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