A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs

Author

Harutyunyan, Gurgen ; Shoukourian, Samvel ; Vardanian, Valery ; Zorian, Yervant

Author_Institution

Synopsys, Inc., Yerevan, Armenia

Volume

31

Issue

6

fYear

2012

fDate

6/1/2012 12:00:00 AM

Firstpage

941

Lastpage

949

Abstract

In this paper, all linked and unlinked static and two-operation dynamic faults are considered. A classification for their description is introduced. To generate a test algorithm for detection of all the considered faults, it was shown that it is not an easy problem. For this purpose, a new structure-oriented method is developed. Based on the proposed method, an efficient test algorithm March LSD of complexity 75N is generated for the detection of the considered linked static and dynamic faults.

Keywords

fault diagnosis; integrated circuit testing; random-access storage; March LSD efficient test algorithm; March test algorithm generation method; RAM; fault detection; linked static fault; structure-oriented method; two-operation dynamic faults; Algorithm design and analysis; Circuit faults; Complexity theory; Couplings; Heuristic algorithms; Integrated circuit modeling; Random access memory; Linked faults; March test; random access memory; static and dynamic faults; test generation;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/TCAD.2012.2184107

Filename

6200436