DocumentCode :
1517418
Title :
Ce Concentration Dependence of Optical and Scintillation Properties for Ce Doped {\\rm LiYF}_{4} Single Crystals
Author :
Yokota, Yuui ; Yanagida, Takayuki ; Abe, Naoto ; Kawaguchi, Noriaki ; Fukuda, Kentaro ; Nikl, Martin ; Yoshikawa, Akira
Author_Institution :
Inst. of Multidiscipl. Res. for Adv. Mater., Tohoku Univ., Miyagi, Japan
Volume :
57
Issue :
3
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
1241
Lastpage :
1244
Abstract :
We have investigated effects of Ce concentration on optical and scintillation properties for Ce doped LiYF4 [Ce:LiYF4] single crystals. Li(Y1-x,Cex)F4 single crystals with more than 75 % transparency were grown by micro-pulling-down method in the range of 0 ≤ x ≤ 0.03 and the crystals with x = 0.05, 0.1 had milky parts originated from remained starting materials. Photoluminescence spectra of all Ce:LiYF4 crystals indicated two emission peaks from Ce3+ ion which was substituted for Y3+ ion site. Light yield and decay time of α-ray irradiation for Ce:LiYF4 crystals were largely affected by Ce concentration and the largest light yield was observed for the crystal with x = 0.02. In contrast, the decay time systematically became faster with an increase of Ce concentration.
Keywords :
alpha-particle effects; crystal growth from melt; doping profiles; lithium compounds; neutron detection; photoluminescence; scintillation; semiconductor counters; semiconductor doping; solid scintillation detectors; Ce concentration; Ce doped LiYF4 single crystals; LiYF4:Ce; alpha-ray irradiation; decay time; light yield; micropulling down method; optical properties; photoluminescence spectra; scintillation properties; Attenuation; Crystalline materials; Crystals; High speed optical techniques; Neutrons; Optical attenuators; Optical materials; Particle beam optics; Photoluminescence; Security; Cerium; crystal growth; fluorine compounds; neutron scintillator;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2010.2040836
Filename :
5485071
Link To Document :
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