• DocumentCode
    1517487
  • Title

    Precise Multiphase Clock Generation Using Low-Jitter Delay-Locked Loop Techniques for Positron Emission Tomography Imaging

  • Author

    Gao, Wu ; Gao, Deyuan ; Brasse, David ; Hu-Guo, Christine ; Hu, Yann

  • Author_Institution
    Northwestern Polytech. Univ., Xi´´an, China
  • Volume
    57
  • Issue
    3
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    1063
  • Lastpage
    1070
  • Abstract
    This paper presents design techniques of a multiphase clock generator using a low-jitter delay-locked loop (DLL) or its array for the developments of high-resolution multi-channel time-to-digital converters (TDCs). The low-jitter technologies for both a single DLL and an array of DLL are discussed. Based on the previous work on the design of a single DLL with 32 delay cells, an array of mixed-mode low-jitter DLLs is proposed for achieving smaller time taps. The array of DLL is successfully designed and embedded into a prototype chip of a three-channel high-resolution TDC in 0.35 CMOS process. The operational range of the DLL in the array is from 50 MHz to 120 MHz. The RMS value of measured cycle-to-cycle jitter in the DLL is about 7 ps while the peak-to-peak value is about 20 ps. A bin size of 71 ps can be achieved by using a reference clock of 100 MHz. The DNL and INL of the evaluated chip are 0.58 LSB and 0.63 LSB, respectively. The static power dissipation of the DLL array is about 23 mW.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; biomedical electronics; clocks; delay lock loops; jitter; mixed analogue-digital integrated circuits; positron emission tomography; signal generators; CMOS process; cycle-to-cycle jitter; frequency 50 MHz to 120 MHz; high-resolution multi-channel time-to-digital converters; low-jitter delay-locked loop; mixed-mode low-jitter DLLs; multiphase clock generator; positron emission tomography; precise multiphase clock generation; size 0.35 mum; static power dissipation; three-channel high-resolution TDC; Application specific integrated circuits; CMOS process; Clocks; Delay; High-resolution imaging; Image resolution; Jitter; Positron emission tomography; Time measurement; Timing; Analog-to-digital converter (ADC); array of DLL; delay locked loop (DLL); multiphase generator; positron emission tomography (PET); time-to-digital converter (TDC);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2010.2044663
  • Filename
    5485081