Making complex mixed-signal telecommunication integrated circuits testable

Author

Roberts, Gordon W. ; Dufort, Benoit

Author_Institution

McGill Univ., Montreal, Que., Canada

Volume

37

Issue

6

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

90

Lastpage

96

Abstract

This article presents a discussion of several methods that can be used to improve the testability of complex mixed-signal telecommunication integrated circuits. We begin by outlining the role of test and its impact on product cost and quality. A brief look at the pending test crises for mixed-signal circuits is also considered. Subsequently, we outline the evolution of test strategies with time, and their corresponding test setups for verifying the function of the analog portion of a mixed-signal circuit. The article also describes several circuit techniques for improving test access and providing built-in self-test solutions for telecommunication circuits

Keywords

built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; telecommunication equipment testing; built-in self-test solutions; circuit techniques; mixed-signal telecommunication integrated circuits; product cost; product quality; test access; test crises; test setups; testability; Automatic testing; Built-in self-test; Circuit testing; Consumer electronics; Cost function; Electronic equipment testing; Integrated circuit testing; Manufacturing; Software testing; System testing;

fLanguage

English

Journal_Title

Communications Magazine, IEEE

Publisher

ieee

ISSN

0163-6804

Type

jour

DOI

10.1109/35.769280

Filename

769280