Challenges in testing core-based system ICs

Author

Marinissen, Erik Jan ; Zorian, Yervant

Author_Institution

Philips Res. Lab., Eindhoven, Netherlands

Volume

37

Issue

6

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

104

Lastpage

109

Abstract

Advances in semiconductor design and manufacturing technology enable the design of complete systems on one IC. To develop these system ICs in a timely manner, traditional IC design in which everything is designed from scratch, is replaced by a design style based on embedding large reusable modules, the so-called cores. Effectively, the design of a core-based IC is partitioned over the core provider(s) and the system-chip integrator. The development of tests should follow the same partitioning. We describe the differences between traditional and core-based test development, and present an overview of current industrial approaches. We list the future challenges regarding standardization, tool development, and academic and industrial research

Keywords

integrated circuit manufacture; integrated circuit technology; integrated circuit testing; standardisation; academic research; core-based system IC testing; core-based test development; industrial approaches; industrial research; large reusable modules; semiconductor design; semiconductor manufacturing technology; standardization; system-chip integrator; systems on chips; tool development; Circuit testing; Companies; Electronic design automation and methodology; Energy consumption; Hardware; Integrated circuit testing; Manufacturing; Printed circuits; Semiconductor device manufacture; System testing;

fLanguage

English

Journal_Title

Communications Magazine, IEEE

Publisher

ieee

ISSN

0163-6804

Type

jour

DOI

10.1109/35.769283

Filename

769283