DocumentCode
1517654
Title
Inferring surface trace and differential structure from 3-D images
Author
Sander, Peter T. ; Zucker, Steven W.
Author_Institution
Inst. Nat. de Recherche en Inf. et en Autom., Le Chesnay, France
Volume
12
Issue
9
fYear
1990
fDate
9/1/1990 12:00:00 AM
Firstpage
833
Lastpage
854
Abstract
Early image understanding seeks to derive analytic representations from image intensities. The authors present steps towards this goal by considering the inference of surfaces from three-dimensional images. Only smooth surfaces are considered and the focus is on the coupled problems of inferring the trace points (the points through which the surface passes) and estimating the associated differential structure given by the principal curvature and direction fields over the estimated smooth surfaces. Computation of these fields is based on determining an atlas of local charts or parameterizations at estimated surface points. Algorithm robustness and the stability of results are essential for analyzing real images; to this end, the authors present a functional minimization algorithm utilizing overlapping local charts to refine surface points and curvature estimates, and develop an implementation as an iterative constraint satisfaction procedure based on local surface smoothness properties. Examples of the recovery of local structure are presented for synthetic images degraded by noise and for clinical magnetic resonance images
Keywords
inference mechanisms; pattern recognition; picture processing; 3D image inference; clinical magnetic resonance images; differential structure; functional minimization algorithm; image understanding; overlapping local charts; principal curvature; robustness; surface smoothness; surface trace; trace points; Algorithm design and analysis; Degradation; Image analysis; Iterative algorithms; Magnetic noise; Magnetic resonance; Minimization methods; Parameter estimation; Robust stability; Stability analysis;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/34.57680
Filename
57680
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