DocumentCode :
1517845
Title :
Room Temperature CW Operation of Short Wavelength Quantum Cascade Lasers Made of Strain Balanced Ga _{bm x} In
Author :
Xie, Feng ; Caneau, Catherine ; LeBlanc, Herve P. ; Visovsky, Nick J. ; Chaparala, Satish C. ; Deichmann, Oberon D. ; Hughes, Lawrence C. ; Zah, Chung-en ; Caffey, David P. ; Day, Timothy
Author_Institution :
Corning, Inc., Corning, NY, USA
Volume :
17
Issue :
5
fYear :
2011
Firstpage :
1445
Lastpage :
1452
Abstract :
We present our recent development of short wavelength quantum cascade lasers (QCLs) made of strain balanced GaxIn1-xAs/AlyIn1-yAs material on InP substrates. We demonstrate room temperature continuous-wave (CW) lasing of the fundamental lateral mode at four wavelengths of 4.6, 4.0, 3.8, and 3.5 μm. We obtained 60-mW CW output power at 10 °C and 3.55-μm wavelength, which is the shortest CW lasing wavelength demonstrated at room temperature by a QCL, to the best of our knowledge. We also performed a life test on λ = 4.6 μm QCL chips. To date, we have accumulated the life test data for more than 11 000 and 4100 h under two aging conditions, 20°C and 0.85-A constant current, and 60°C and 1-A constant current, respectively.
Keywords :
III-V semiconductors; ageing; aluminium compounds; gallium arsenide; indium compounds; integrated optics; laser modes; life testing; quantum cascade lasers; GaxIn1-xAs-AlyIn1-yAs; InP; InP substrates; aging; continuous-wave output power; current 0.85 A; current 1 A; fundamental lateral mode; room temperature continuous-wave lasing; short wavelength quantum cascade lasers; strain balanced material; temperature 10 degC; temperature 20 degC; temperature 293 K to 298 K; temperature 60 degC; wavelength 4.6 mum to 3.5 mum; Materials; Measurement by laser beam; Power generation; Quantum cascade lasers; Semiconductor device measurement; Strain; Temperature measurement; Fundamental mode; quantum cascade lasers (QCLs); reliability; semiconductor lasers;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2011.2136325
Filename :
5768060
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