Title :
Runtime Power Management of 3-D Multi-Core Architectures Under Peak Power and Temperature Constraints
Author :
Kang, Kyungsu ; Kim, Jungsoo ; Yoo, Sungjoo ; Kyung, Chong-Min
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
fDate :
6/1/2011 12:00:00 AM
Abstract :
3-D integration is a new technology that overcomes the limitations of 2-D integrated circuits, e.g., power and delay induced from long interconnect wires, by stacking multiple dies to increase logic integration density. However, chip-level power and peak temperature are the major performance limiters in 3-D multi-core architectures. In this paper, we propose a runtime power management method for both peak power and temperature-constrained 3-D multi-core systems in order to maximize the instruction throughput. The proposed method exploits dynamic temperature slack (defined as peak temperature constraint minus current temperature) and workload characteristics (e.g., instructions per cycle and memory-boundness) as well as thermal characteristics of 3-D stacking architectures. Compared with existing thermal-aware power management solutions for 3-D multi-core systems, our method yields up to 34.2% (average 18.5%) performance improvement in terms of instructions per second without significant additional energy consumption.
Keywords :
cooling; microprocessor chips; multiprocessing systems; power aware computing; thermal management (packaging); 2D integrated circuit; 3D integration; 3D stacking architecture; chip-level power; dynamic temperature slack; energy consumption; interconnect wire; limiter; logic integration density; multiple dies; peak power; peak temperature; runtime power management method; temperature-constrained 3D multicore system; thermal characteristic; thermal-aware power management solution; Cooling; Multicore processing; Runtime; Steady-state; Temperature; Thermal management; Thermal resistance; 3-D integration; chip-multiprocessor; dynamic voltage and frequency scaling (DVFS); power management; thermal management;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2010.2101371