A new detection system with polycapillary conic collimator for high-localized analysis of X-ray fluorescence emission

Author

Fiorini, C. ; Longoni, A. ; Bjeoumikhov, A.

Author_Institution

Dipt. di Ingegneria Nucl., Politecnico di Milano, Italy

Volume

48

Issue

3

fYear

2001

fDate

6/1/2001 12:00:00 AM

Firstpage

268

Lastpage

271

Abstract

In this paper, we present a new detection system conceived for the X-ray fluorescence (XRF) analysis of the radiation emitted by very small areas on the sample. The system is based on the use of a polycapillary conic collimator which captures the XRF emitted only from a local area of the sample independently on how extended is the X-ray excitation. The use of a Peltier-cooled silicon drift detector allows to achieve high energy resolution with a very compact system configuration. In this first prototype, a spatial resolution of about 150 μm has been verified in the analysis of thin metal strips. Moreover, the results of a first X-Y scanning for elemental mapping on a sample surface are also reported

Keywords

X-ray detection; X-ray fluorescence analysis; silicon radiation detectors; 150 micron; Peltier-cooled Si drift detector; Si; X-ray fluorescence; polycapillary conic collimator; spatial resolution; Collimators; Energy resolution; Fluorescence; Prototypes; Radiation detectors; Silicon; Spatial resolution; Strips; X-ray detection; X-ray detectors;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.940063

Filename

940063