DocumentCode
1518343
Title
A statistical theory of digital circuit testability
Author
Seth, Sharad C. ; Agrawal, Vishwani D. ; Farhat, Hassan
Author_Institution
Dept. of Comput. Sci. & Eng., Nebraska Univ., Lincoln, NE, USA
Volume
39
Issue
4
fYear
1990
fDate
4/1/1990 12:00:00 AM
Firstpage
582
Lastpage
586
Abstract
A relation between the average fault coverage and circuit testability is developed. The statistical formulation allows computation of coverage for deterministic and random vectors. The following applications of this analysis are discussed: determination of circuit testability from fault simulation, coverage prediction from testability analysis, prediction of test length, and test generation by fault sampling
Keywords
digital circuits; fault location; statistical analysis; average fault coverage; computation of coverage; coverage prediction; deterministic vectors; digital circuit testability; fault sampling; fault simulation; random vectors; statistical theory; test generation; Analytical models; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Digital circuits; Electrical fault detection; Fault detection; Sampling methods;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.54854
Filename
54854
Link To Document