• DocumentCode
    1518348
  • Title

    Aliasing probability for multiple input signature analyzer

  • Author

    Pradhan, Dhiraj K. ; Gupta, Sandeep K. ; Karpovsky, Mark G.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
  • Volume
    39
  • Issue
    4
  • fYear
    1990
  • fDate
    4/1/1990 12:00:00 AM
  • Firstpage
    586
  • Lastpage
    591
  • Abstract
    Single and multiple multiple-input-signature-register (MISR) aliasing probability expressions are presented for arbitrary test lengths. A framework, based on algebraic codes, is developed for the analysis and synthesis of MISR-based test response compressors for BIST. This framework is used to develop closed-form expressions for the aliasing probability of MISR for arbitrary test length. An error model, based on q-ary symmetric channel, is proposed using more realistic assumptions. Results are presented that provide the weight distributions for q-ary codes (q=2m, where the circuit under test has m outputs). These results are used to compute the aliasing probability for the MISR compression technique for arbitrary test lengths. This result is extended to compression using two different MISRs. It is shown that significant improvements can be obtained by using two signature analyzers instead of one. The weight distribution of a class of codes of arbitrary length is also given
  • Keywords
    logic analysers; algebraic codes; aliasing probability expressions; arbitrary test lengths; closed-form expressions; compression technique; error model; multiple input signature analyzer; multiple-input-signature-register; q-ary symmetric channel; test response compressors; weight distributions; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Digital circuits; Fault tolerance; Random variables; Redundancy; Reed-Solomon codes; Stochastic processes;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.54855
  • Filename
    54855