• DocumentCode
    1518520
  • Title

    UV radiation resistance and solar blindness of CsI and KBr photocathodes

  • Author

    Tremsin, A.S. ; Siegmund, O.H.W.

  • Author_Institution
    Space Sci. Lab., California Univ., Berkeley, CA, USA
  • Volume
    48
  • Issue
    3
  • fYear
    2001
  • fDate
    6/1/2001 12:00:00 AM
  • Firstpage
    421
  • Lastpage
    425
  • Abstract
    A detailed study of the stability of CsI and KBr photocathodes under UV irradiation is presented. UV quantum efficiency degradation was found to be more pronounced at lower illumination intensity for the same accumulated dose and illumination wavelength. For an equal number of extracted photoelectrons in-band UV exposure led to a larger sensitivity decay as compared to out-of-band illumination. The angle of radiation incidence was not important for UV sensitivity degradation, while changes of visible light rejection (i.e., degradation of solar blindness) did depend on the incidence angle: the photocathodes illuminated at normal incidence were activated much faster than the films irradiated at grazing angle. We found that the increase of visible sensitivity can be characterized by the total accumulated dose and is independent of irradiation flux during UV activation. We also observed that heat annealing substantially improves the visible light rejection of CsI photocathodes
  • Keywords
    microchannel plates; photocathodes; position sensitive particle detectors; ultraviolet detectors; ultraviolet radiation effects; CsI; CsI and KBr photocathode; CsI photocathodes; KBr; KBr photocathode; UV quantum efficiency degradation; UV radiation resistance; accumulated dose; grazing angle; heat annealing; illumination wavelength; microchannel plate; solar blindness; visible light rejection; Blindness; Cathodes; Degradation; Detectors; Extraterrestrial measurements; Lighting; Microchannel; Sputtering; Stability; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.940092
  • Filename
    940092