Title :
Frequency-dependent parameter extraction of on-chip interconnects by combination of two-dimensional FDTD and time signal prediction method
Author :
Yuan, Zhengyu ; Li, Zhengfan ; Zou, Minliu
Author_Institution :
Dept. of Electron. Eng., Shanghai Jiaotong Univ., China
fDate :
4/1/1999 12:00:00 AM
Abstract :
An efficient two-dimensional finite difference time domain method combined with a time signal prediction method has been proposed for the frequency-dependent parameter extraction of on-chip interconnection lines. This algorithm leads to a significant reduction in CPU time and storage requirements as compared with the conventional FDTD method
Keywords :
integrated circuit interconnections; frequency-dependent parameter extraction; on-chip interconnect; time signal prediction method; two-dimensional FDTD algorithm;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19990309
