Title :
Analysis of Noncoherent ASK Modulation-Based RF-Interconnect for Memory Interface
Author :
Kim, Yanghyo ; Tam, Sai-Wang ; Byun, Gyung-Su ; Wu, Hao ; Nan, Lan ; Reinman, Glenn ; Cong, Jason ; Chang, Mau-Chung Frank
Author_Institution :
Electr. Eng. Dept., Univ. of California-Los Angeles, Los Angeles, CA, USA
fDate :
6/1/2012 12:00:00 AM
Abstract :
A noncoherent amplitude shift keying (ASK)-based RF-interconnect (RF-I) system design for off-chip communication is analyzed. The proposed RF-I system exploits the simple architecture and characteristics of noncoherent ASK modulation. This provides an efficient way of increasing interconnect bandwidth by transmitting an RF-modulated data stream simultaneously with a conventional baseband counterpart over a shared off-chip transmission line. Both analysis and tested results prove that the performance of the proposed dual-band (RF+baseband) interconnect system is not limited by thermal noise interference. Therefore, a more sophisticated modulation scheme and/or coherent receiving scheme becomes unnecessary within the scope of system requirements. In addition, it confirms that the proposed inductive coupling network is able to support simultaneous bidirectional communications without using complicated replica circuits or additional filters to isolate simultaneous baseband and RF-band data streams.
Keywords :
amplitude shift keying; integrated circuit interconnections; semiconductor storage; thermal noise; RF-interconnect system design; bidirectional communications; dual-band interconnect system; inductive coupling network; memory interface; noncoherent ASK modulation; noncoherent amplitude shift keying; off-chip communication; off-chip transmission line; thermal noise interference; Amplitude shift keying; Bandwidth; Couplings; Receivers; Signal to noise ratio; Dual-band signaling; RF-interconnect; inductive coupling; memory interface; noncoherent amplitude shift keying modulation; simultaneous bidirectional communication;
Journal_Title :
Emerging and Selected Topics in Circuits and Systems, IEEE Journal on
DOI :
10.1109/JETCAS.2012.2193511