Analysis of sharp metal edges at 45° to the FDTD grid

Author

Esselle, Karu P. ; Okoniewski, Michal ; Stuchly, Maria A.

Author_Institution

Dept. of Electron., Macquarie Univ., Sydney, NSW, Australia

Volume

9

Issue

6

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

221

Lastpage

223

Abstract

New finite-difference time-domain (FDTD) update equations for sharp metal edges are presented. The edge is assumed to be diagonal to the Yee cell faces. Derived using the contour-path method, the new equations properly model the singular field near the edge even with a relatively coarse grid. A dramatic improvement in computed accuracy was observed when a stripline with two sharp edges was analyzed using the new equations instead of standard FDTD techniques. The new equations are found to be stable even with the maximum allowed time step, easy to implement, and do not increase computer memory and time requirements

Keywords

electromagnetic field theory; finite difference time-domain analysis; microstrip lines; numerical stability; strip lines; FDTD grid; FDTD update equations; Yee cell faces; contour-path method; finite-difference time-domain method; sharp metal edges; singular field modelling; stripline; Computational modeling; Councils; Electromagnetic fields; Equations; Finite difference methods; Magnetic field measurement; Microstrip; Stripline; Strips; Time domain analysis;

fLanguage

English

Journal_Title

Microwave and Guided Wave Letters, IEEE

Publisher

ieee

ISSN

1051-8207

Type

jour

DOI

10.1109/75.769527

Filename

769527