DocumentCode :
1519140
Title :
A deterministic nonlinear-capacitor model for single-electron tunneling junctions
Author :
Hänggi, Martin ; Chua, Leon O.
Author_Institution :
Notre Dame Univ., IN, USA
Volume :
48
Issue :
8
fYear :
2001
fDate :
8/1/2001 12:00:00 AM
Firstpage :
1019
Lastpage :
1022
Abstract :
Single-electron tunneling junctions (SETJs) have intriguing properties which make them a primary nanoelectronic device for highly compact, fast, and low-power circuits. However, standard models for SETJs are based on a quantum mechanical approach which is very impractical for the analysis and design of SETJ-based circuitry, where a simple, preferably deterministic model is a prerequisite. We verify by physics-based Monte Carlo simulations that the tunneling junction can in fact be modeled by a piecewise linear voltage charge relation, which, from the circuit-theoretic perspective, is a nonlinear capacitor
Keywords :
Monte Carlo methods; low-power electronics; nanotechnology; piecewise linear techniques; semiconductor device models; single electron transistors; SETJs; circuit-theoretic perspective; deterministic nonlinear-capacitor model; low-power circuits; nanoelectronic device; physics-based Monte Carlo simulations; piecewise linear voltage charge relation; single-electron tunneling junctions; tunneling junction; Capacitance; Circuit simulation; Circuit testing; Electrons; Electrostatics; Nanoscale devices; Piecewise linear techniques; Quantum mechanics; Tunneling; Voltage;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7122
Type :
jour
DOI :
10.1109/81.940193
Filename :
940193
Link To Document :
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