• DocumentCode
    1519357
  • Title

    Using 10 V Josephson voltage standards to estimate the uncertainty of Zener voltage references as traveling standards

  • Author

    Lo-Hive, Jean-Pierre ; Reymann, D. ; Genevès, G.

  • Author_Institution
    Lab. Central des Ind. Electr., Bur. Nat. de Metrol., Fontenay Aux Roses, France
  • Volume
    48
  • Issue
    2
  • fYear
    1999
  • fDate
    4/1/1999 12:00:00 AM
  • Firstpage
    253
  • Lastpage
    256
  • Abstract
    In anticipation of a European comparison of 10 V Josephson array voltage standards (EUROMET project 429 led by the NMi VSL), the BIPM and the BNM-LCIE Josephson standards have been compared by means of Zener traveling references. A mean difference of 5 parts in 109 has been found with a standard uncertainty of 6 parts in 109. The results show that the performance of the Zener references could be the main cause of uncertainty in such a comparison
  • Keywords
    Josephson effect; Zener diodes; measurement standards; measurement uncertainty; voltage measurement; 10 V; BIPM standards; BNM-LCIE standards; EUROMET project; Josephson voltage standards; Zener voltage references; standard uncertainty; traveling standards; Availability; Battery charge measurement; Detectors; Laboratories; Measurement standards; Niobium; Performance evaluation; Uncertainty; Video recording; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.769576
  • Filename
    769576
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1519357