Title :
Using 10 V Josephson voltage standards to estimate the uncertainty of Zener voltage references as traveling standards
Author :
Lo-Hive, Jean-Pierre ; Reymann, D. ; Genevès, G.
Author_Institution :
Lab. Central des Ind. Electr., Bur. Nat. de Metrol., Fontenay Aux Roses, France
fDate :
4/1/1999 12:00:00 AM
Abstract :
In anticipation of a European comparison of 10 V Josephson array voltage standards (EUROMET project 429 led by the NMi VSL), the BIPM and the BNM-LCIE Josephson standards have been compared by means of Zener traveling references. A mean difference of 5 parts in 109 has been found with a standard uncertainty of 6 parts in 109. The results show that the performance of the Zener references could be the main cause of uncertainty in such a comparison
Keywords :
Josephson effect; Zener diodes; measurement standards; measurement uncertainty; voltage measurement; 10 V; BIPM standards; BNM-LCIE standards; EUROMET project; Josephson voltage standards; Zener voltage references; standard uncertainty; traveling standards; Availability; Battery charge measurement; Detectors; Laboratories; Measurement standards; Niobium; Performance evaluation; Uncertainty; Video recording; Voltage measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
