DocumentCode :
1519516
Title :
Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor
Author :
Jeffery, Anne-Marie ; Lee, Lai H. ; Shields, John Q.
Author_Institution :
Electron. & Electr. Eng. Lab., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume :
48
Issue :
2
fYear :
1999
fDate :
4/1/1999 12:00:00 AM
Firstpage :
356
Lastpage :
359
Abstract :
The calculable capacitor at National Institute of Standards and Technology (NIST) links the U.S. capacitance unit to the SI unit and has a relative standard uncertainty of 2×10-8. Geometrical imperfections are one of the largest sources of this uncertainty. Tests with a model calculable capacitor have been done to better evaluate and reduce this uncertainty. These included evaluations of the effect of eccentricity of the blocking electrodes used to define the capacitor´s length and of uniform taper on all the calculable capacitor bars. In addition, the effect of tilt of the blocking electrode and taper in three or fewer bars was investigated. A new cone-shape for the tip of the blocking electrode was also studied
Keywords :
capacitance measurement; capacitors; measurement standards; measurement uncertainty; NIST calculable capacitor; SI unit; blocking electrodes; capacitance unit; capacitor bars; cone-shape; cross-capacitor; eccentricity effect; electrode tip; geometrical imperfections effect; model tests; relative standard uncertainty; tilt effect; uniform taper; Bars; Capacitance measurement; Capacitors; Electrodes; Length measurement; NIST; Optical interferometry; Solid modeling; Testing; Uncertainty;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.769600
Filename :
769600
Link To Document :
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