Thin-film cryogenic current comparator

Author

Seppä, Heikki ; Satrapinski, A. ; Kiviranta, Mikko ; Virkki, Vesa

Author_Institution

VTT Autom., Meas. Technol., Espoo, Finland

Volume

48

Issue

2

fYear

1999

fDate

4/1/1999 12:00:00 AM

Firstpage

365

Lastpage

369

Abstract

We analyze a thin-film cryogenic current comparator (CCC) intended to be used in ac measurements. Our analysis shows that by calibrating the dc ratio error of the thin-film CCC against a conventional CCC, it can be used up to 10 kHz as a sensitive and highly accurate current comparator. We have fabricated a practical 1:1 planar CCC integrated with a low-noise SQUID magnetometer. The preliminary experiments obtained from the 1:1 comparator are described

Keywords

SQUID magnetometers; bridge circuits; current comparators; electric resistance measurement; measurement standards; quantum Hall effect; thin film circuits; 10 kHz; AC measurements; AC resistance bridge; DC ratio error; current resolution; highly accurate current comparator; low-noise SQUID magnetometer integrated; quantised Hall resistance; resistance measurement; sensitivity; thin-film cryogenic current comparator; Calibration; Cryogenics; Electric resistance; Electrical resistance measurement; Frequency; Inductance; Metrology; Strips; Superconducting coils; Transistors;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.769602

Filename

769602