• DocumentCode
    1519629
  • Title

    Mode-Localized Displacement Sensing

  • Author

    Thiruvenkatanathan, P. ; Seshia, A.A.

  • Author_Institution
    Dept. of Eng., Univ. of Cambridge, Cambridge, UK
  • Volume
    21
  • Issue
    5
  • fYear
    2012
  • Firstpage
    1016
  • Lastpage
    1018
  • Abstract
    We report the construction of a new class of micromachined displacement sensors that employ the phenomenon of vibration-mode localization for monitoring minute inertial displacements. It is demonstrated both theoretically and experimentally that the eigenstate-shifted output signal of such mode-localized displacement sensors may be as high as 1000 times greater than corresponding resonant-frequency variations that serve as the output in the more traditional vibratory resonant micromechanical displacement/motion sensors. The high parametric sensitivities attainable in such mode-localized displacement sensors, together with their inherent advantages of improved environmental robustness and electrical tunability, suggest an alternative approach in achieving improved sensitivity and stability in high-resolution displacement transduction.
  • Keywords
    circuit resonance; displacement measurement; eigenvalues and eigenfunctions; microsensors; sensitivity analysis; vibrational modes; eigenstate-shifted output signal; electrical tunability; environmental robustness; high-resolution displacement transduction; micromachined displacement sensor; minute inertial displacement monitoring; mode-localized displacement sensing; mode-localized displacement sensor; parametric sensitivity; resonant-frequency variation; stability; vibration-mode localization; vibratory resonant micromechanical displacement/motion sensor; Couplings; Displacement measurement; Optical resonators; Resonant frequency; Sensitivity; Sensors; Vibrations; Microelectromechanical resonators; mode localization; mode-localized sensing;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2012.2198047
  • Filename
    6202666