Automated ADC characterization using the histogram test stimulated by Gaussian noise

Author

Martins, Raul Carneiro ; Serra, António Manuel da Cruz

Author_Institution

Inst. de Telecommun., Lisbon Tech. Univ., Portugal

Volume

48

Issue

2

fYear

1999

fDate

4/1/1999 12:00:00 AM

Firstpage

471

Lastpage

474

Abstract

A broadband variant of the histogram test where Gaussian noise is used as a stimulus signal is presented. A methodology allowing for an automated and extensive characterization of analog-to-digital converters (ADCs) is given. Tolerance and confidence intervals are determined both for the integral nonlinearity (INL) and differential nonlinearity (DNL) vectors, related to the number of samples acquired. Experimental results of the characterization of a VXI waveform digitizer using this methodology are shown

Keywords

Gaussian noise; analogue-digital conversion; automatic testing; integrated circuit testing; normal distribution; white noise; Gaussian noise stimulation; PDF; VXI waveform digitizer; automated ADC characterization; confidence intervals; differential nonlinearity vectors; histogram test; integral nonlinearity vectors; merit figures; normally distributed noise; pseudo-random sequence; statistical testing; tolerance; transfer function; white noise; Automatic testing; Frequency; Gaussian noise; Histograms; Noise generators; Signal generators; Statistical analysis; Transfer functions; Voltage; White noise;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.769631

Filename

769631