DocumentCode
1519853
Title
Cryocooled sapphire oscillator with ultrahigh stability
Author
Wang, Rabi T. ; Dick, G. John
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume
48
Issue
2
fYear
1999
fDate
4/1/1999 12:00:00 AM
Firstpage
528
Lastpage
531
Abstract
We present test results and design details for the first short-term frequency standard to achieve ultrahigh stability without the use of liquid helium. With refrigeration provided by a commercial cryocooler, the compensated sapphire oscillator (10 K CSO) makes available the superior short-term stability and phase noise performance of cryogenic oscillators without periodic interruptions for cryogen replacement. Technical features of the 10 K CSO include use of a two-stage cryocooler with vibration isolation by helium gas at atmospheric pressure, and a new sapphire/ruby resonator design giving compensated operation at 8 K to 10 K with Q=(1-2)×109. Stability of the first unit shows an Allan deviation of σy ⩽2.5×10-15 for measuring times of 200 s⩽τ⩽600 s. We also present results showing the capability of the 10 K CSO to eliminate local oscillator degradation for atomic frequency standards. Configured as local oscillator (L.O.) for the LITS-7 trapped mercury ion frequency standard, the CSO/LITS combination demonstrated a limiting performance of 3.0×10-14/τ 1/2, the lowest value measured to date for a passive atomic frequency standard, and virtually identical to the value calculated from photon statistics
Keywords
Q-factor; cryogenic electronics; dielectric resonator oscillators; frequency stability; frequency standards; phase noise; sapphire; 10 K; Al2O3; Allan variance; LITS-7 trapped mercury ion frequency standard; Q-factor; compensated sapphire oscillator; cryocooler; cryogenic oscillator; local oscillator; phase noise; sapphire/ruby resonator; ultrahigh stability; Atmospheric measurements; Atomic clocks; Cryogenics; Frequency; Helium; Local oscillators; Phase noise; Refrigeration; Stability; Testing;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.769650
Filename
769650
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