Improved interferometric method to measure near-carrier AM and PM noise

Author

Rubiola, Enrico ; Giordano, Vincent ; Groslambert, Jacques

Author_Institution

Politecnico di Torino, Italy

Volume

48

Issue

2

fYear

1999

fDate

4/1/1999 12:00:00 AM

Firstpage

642

Lastpage

646

Abstract

An improved version of the interferometric method to measure near-carrier AM and PM noise is being presented. The main feature of this scheme is the capability to reduce the instrument noise by correlating the output of two equal interferometers built around the same device to be tested, thus enhancing the sensitivity. Two double interferometers are described, operating in the microwave and VHF bands. The latter shows a noise floor of -194 dB rad²/Hz when the signal power is +8 dBm. The sensitivity of both the instruments turns out to be significantly higher than the ratio of the thermal noise divided by the carrier power

Keywords

amplitude modulation; electric noise measurement; microwave measurement; phase modulation; radiowave interferometry; AM noise; PM noise; VHF interferometry; double interferometer; microwave interferometry; near-carrier noise measurement; Instruments; Interferometers; Microwave devices; Noise measurement; Noise reduction; Phase noise; Power amplifiers; Temperature sensors; Testing; White noise;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.769677

Filename

769677