DocumentCode :
1520245
Title :
400-mW single-frequency 660-nm semiconductor laser
Author :
Pezeshki, B. ; Hagberg, M. ; Zelinski, M. ; DeMars, S.D. ; Kolev, E. ; Lang, R.J.
Author_Institution :
SDL Inc., San Jose, CA, USA
Volume :
11
Issue :
7
fYear :
1999
fDate :
7/1/1999 12:00:00 AM
Firstpage :
791
Lastpage :
793
Abstract :
Using an angled-grating broad-area structure in GaInP-AlInP material system, we obtain single spatial and longitudinal-mode operation at 660 nm. The grating stabilizes the mode to deliver over 400-mW continuous-wave at room temperature from a 60-μm-wide stripe. This is about ten times higher than conventional distributed-feedback power output levels, and is the highest single-frequency power from a monolithic semiconductor device in this wavelength range. These devices should be useful for single-mode-fiber coupling and in applications where high-wavelength stability is required, such as spectroscopy, interferometry, or metrology.
Keywords :
III-V semiconductors; aluminium compounds; diffraction gratings; distributed feedback lasers; gallium compounds; indium compounds; laser beam applications; laser beams; laser feedback; laser modes; optical fabrication; optical fibre couplers; semiconductor lasers; 298 K; 400 mW; 60 mum; 660 nm; GaInP-AlInP; GaInP-AlInP material system; angled-grating broad-area structure; continuous-wave laser; distributed-feedback power output levels; grating; high-wavelength stability; interferometry; longitudinal-mode operation; metrology; monolithic semiconductor device; room temperature; semiconductor laser; single-frequency laser; single-frequency power; single-mode-fiber coupling; spatial mode operation; spectroscopy; Gratings; Interferometry; Laser modes; Optical materials; Semiconductor devices; Semiconductor lasers; Semiconductor materials; Spectroscopy; Stability; Temperature;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.769709
Filename :
769709
Link To Document :
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