Accurate Chromatic Dispersion Characterization of Photonic Integrated Circuits

Author

Mas, S. ; Matres, J. ; Martí, J. ; Oton, C.J.

Author_Institution

Valencia Nanophotonics Technol. Center, Univ. Politec. de Valencia, Valencia, Spain

Volume

4

Issue

3

fYear

2012

fDate

6/1/2012 12:00:00 AM

Firstpage

825

Lastpage

831

Abstract

An accurate technique to characterize chromatic dispersion and its slope versus wavelength is reported. The method is based on a heterodyne Mach-Zehnder interferometer, which is immune to thermal phase noise by using a counterpropagating reference beam. Chromatic dispersion profiles are obtained over a broad wavelength region even in short waveguides with considerable loss. Conventional strip silicon waveguides as well as slotted geometries are considered. Theoretical simulations are also presented for comparison, which show good agreement with the experimental results.

Keywords

Mach-Zehnder interferometers; elemental semiconductors; integrated optics; optical dispersion; optical waveguides; phase noise; silicon; chromatic dispersion profiles; counterpropagating reference beam; heterodyne Mach-Zehnder interferometer; photonic integrated circuits; strip waveguides; thermal phase noise; Chromatic dispersion; Optical fiber dispersion; Optical waveguides; Phase measurement; Phase noise; Wavelength measurement; Silicon nanophotonics; waveguides;

fLanguage

English

Journal_Title

Photonics Journal, IEEE

Publisher

ieee

ISSN

1943-0655

Type

jour

DOI

10.1109/JPHOT.2012.2199294

Filename

6203348