• DocumentCode
    152080
  • Title

    Characterization of liquid crystal polymer from 110 GHz to 170 GHz

  • Author

    Khan, Wasif T. ; Donado Morcillo, Carlos A. ; Ulusoy, A. Cagri ; Papapolymerou, John

  • Author_Institution
    Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2014
  • fDate
    19-23 Jan. 2014
  • Firstpage
    157
  • Lastpage
    159
  • Abstract
    Liquid crystal polymer is a promising substrate for mm-wave packaging. In this work, we present the characterization of liquid crystal polymer from 110 GHz to 170 GHz. The microstrip ring resonator method is used for the relative permittivity and loss tangent extraction at mm-wave frequencies. The effect of radiation loss in the extraction of loss tangent is analyzed through full electromagnetic 3D models to verify that radiation loss can be neglected for the particular geometry under study. The Monte Carlo uncertainty analysis is used to analyze the uncertainty of the method taking into account the uncertainty of each measurement involved in the characterization. Using a frequency dispersive model for the effective permittivity for the microstrip, the relative permittivity of LCP is extracted to be 3.17 and the loss tangent varies from 0.0055 to 0.009. This work is the first to characterize the liquid crystal polymer in D-band.
  • Keywords
    Monte Carlo methods; dielectric losses; integrated circuit packaging; liquid crystal polymers; permittivity; Monte Carlo uncertainty analysis; frequency 110 GHz to 170 GHz; frequency dispersive model; liquid crystal polymer; loss tangent extraction; microstrip ring resonator method; mm-wave packaging; radiation loss; relative permittivity; Dielectric losses; Liquid crystal polymers; Microstrip; Optical ring resonators; Permittivity; Resonant frequency; D-band; dielectric characterization; liquid crystal polymer (LCP); loss tangent; millimeter-wave frequencies; packaging; ring resonator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio and Wireless Symposium (RWS), 2014 IEEE
  • Conference_Location
    Newport Beach, CA
  • Print_ISBN
    978-1-4799-2298-7
  • Type

    conf

  • DOI
    10.1109/RWS.2014.6830138
  • Filename
    6830138