• DocumentCode
    1520961
  • Title

    Allan Variance Analysis of Josephson Voltage Standard Comparison for Data Taken at Unequal Time Intervals

  • Author

    Tang, Yi-hua ; Solve, Stéphane ; Witt, Thomas J.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    60
  • Issue
    7
  • fYear
    2011
  • fDate
    7/1/2011 12:00:00 AM
  • Firstpage
    2248
  • Lastpage
    2254
  • Abstract
    Stochastic serial correlations are often ignored in the statistical uncertainty (Type A) analysis of measurement values. For repeated measurements, the standard deviation of the mean is often used to specify Type-A uncertainty, but it is frequently underestimated by assuming that it is given by the standard deviation divided by the square root of the number of measurements. Methods of time-series analysis such as the Allan variance (Avar) formalism give realistic estimates of Type-A uncertainty, but they require equal time intervals between successive measurements. This requirement is difficult to satisfy in comparisons of Josephson voltage standards (JVSs) because of the instability of the voltage steps and the small number of repeated measurements. A JVS comparison was made using a completely automatic compact JVS. The time intervals were uneven; thus, we studied the effect of their irregularity on the Avar by simulating data having the same noise model and uneven time intervals as the measured data. We found that, for this JVS comparison, the Avar is only slightly affected by uneven intervals. The noise was found to be a mixture of white and 1/f noise. The latter limits the Allan deviation to 0.64 nV after 14.3 h of measurement. The method of simulating data this way should be applicable to other complex measurement situations.
  • Keywords
    1/f noise; Josephson effect; measurement standards; measurement uncertainty; statistical analysis; stochastic processes; time series; voltage measurement; white noise; 1/f noise; Allan variance analysis; Josephson voltage standard; Type-A uncertainty estimation; automatic compact JVS; measurement value uncertainty; noise model; standard deviation; statistical uncertainty analysis; stochastic serial correlation; time-series analysis; voltage step instability; white noise; Measurement uncertainty; NIST; Time measurement; Uncertainty; Voltage measurement; White noise; $1/f$ noise; Allan variance (Avar); Josephson voltage standard (JVS) comparison; pressure effect; uncertainty;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2011.2132190
  • Filename
    5771108