• DocumentCode
    1521100
  • Title

    Investigation of Thickness Effect on Electric Breakdown Strength of Polymers Under Nanosecond Pulses

  • Author

    Zhao, Liang ; Liu, Guo-Zhi ; Su, Jian-cang ; Pan, Ya-feng ; Zhang, Xi-bo

  • Author_Institution
    Key Lab. of Phys. Electron. & Devices of Minist. of Educ., Xi´´an Jiaotong Univ., Xi´´an, China
  • Volume
    39
  • Issue
    7
  • fYear
    2011
  • fDate
    7/1/2011 12:00:00 AM
  • Firstpage
    1613
  • Lastpage
    1618
  • Abstract
    The thickness effect on electric breakdown strength (EBD) of four kinds of polymers under nanosecond pulses is investigated. The polymers are polyethylene, PTFE, PMMA, and nylon. The test samples are 0.5-3.5 mm in thickness (d) and are immersed in transformer oil. The nanosecond pulse is based on a Tesla-type generator, TPG200, which is with values of pulsewidth of 8.5 ns and rise time of 1.5 ns. The experimental results show that EBD is 1-2 MV/cm and decreases as d increases. The dependence of EBD on d is analyzed with the Weibull statistical distribution. It is concluded that logEBD versus log d is linear. By replotting the experimental data and by comparing with Martin´s results, it is found that the slope for the linear dependence is about -1/8. With this conclusion, the breakdown probability is researched. It is shown that, to get a breakdown probability as low as 0.5%, the applied field should be decreased to about half of EBD.
  • Keywords
    Weibull distribution; electric breakdown; polyethylene insulation; transformer oil; PMMA; PTFE; TPG200; Tesla-type generator; Weibull statistical distribution; breakdown probability; electric breakdown strength; linear dependence; nanosecond pulses; nylon; polyethylene; polymers; size 0.5 mm to 3.5 mm; thickness effect; time 1.5 ns; transformer oil; Electric breakdown; Electrodes; Generators; Insulators; Oil insulation; Plastics; Weibull distribution; Breakdown mechanism; Weibull distribution; electric breakdown strength; polymers; thickness effect;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2011.2143435
  • Filename
    5771129