Title :
Finite-element analysis of generalized V- and W-shaped edge and broadside-edge-coupled shielded microstrip lines on anisotropic medium
Author :
Yan, Yue ; Pramanick, Protap
Author_Institution :
Dept. of Electr. Eng., Saskatchewan Univ., Saskatoon, Sask., Canada
fDate :
9/1/2001 12:00:00 AM
Abstract :
This paper presents detailed finite-element analysis of generalized V- and W-shaped shielded microstrip lines in an anisotropic medium. The computed results show detailed quasistatic characteristics of the effective dielectric constant, characteristic impedance, and conductor loss of the lines. The broadside edge coupled lines are proposed for the first time in this paper. Unlike the previous analysis based on the conformal mapping method, this analysis takes into account the top walls and sidewalls, finite metallization thickness, and dielectric anisotropy. The results presented in this paper will considerable advance microwave-integrated-circuit technology using V- and W-shaped shielded microstrip lines
Keywords :
anisotropic media; coupled transmission lines; electric impedance; electromagnetic shielding; finite element analysis; metallisation; microstrip lines; permittivity; transmission line theory; FEM; MIC technology; V-shaped edge-coupled lines; W-shaped edge-coupled lines; anisotropic medium; broadside-edge-coupled lines; characteristic impedance; conductor loss; dielectric anisotropy; effective dielectric constant; finite metallization thickness; finite-element analysis; microwave-integrated-circuit technology; quasistatic characteristics; shielded microstrip lines; sidewalls; top walls; Anisotropic magnetoresistance; Conductors; Conformal mapping; Dielectric constant; Dielectric losses; Finite element methods; Impedance; Metallization; Microstrip; Microwave technology;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
