Title :
A 12 b 5-to-50 MS/s 0.5-to-1 V Voltage Scalable Zero-Crossing Based Pipelined ADC
Author :
Lee, Sunghyuk ; Chandrakasan, Anantha P. ; Lee, Hae-Seung
Author_Institution :
Massachusetts Inst. of Technol. (MIT), Cambridge, MA, USA
fDate :
7/1/2012 12:00:00 AM
Abstract :
A voltage scalable zero-crossing based (ZCB) pipelined ADC built in 65 nm CMOS is described. The highly digital implementation characteristic of the ZCB circuit technique enables energy efficient operation and supply voltage scaling. Several new techniques including the unidirectional coarse-fine charge transfer scheme, programmable ramp rates, and flash resistor ladder scaling, are developed to allow efficient operation at different supply voltages as well as to extend the supply voltage range down to 0.5 V. Two versions, the first fabricated in 65 nm GP (general purpose) technology, and the second in 65 nm LP (low power) technology from an identical design file show similar performance characteristics except for the power supply voltage ranges, demonstrating the robustness of the design. At 1.0 V (GP)/1.2 V (LP) nominal supply and 50 MS/s, the ADC achieves 67.7 dB (GP)/68.1 dB (LP) SNDR after calibration while dissipating 4.07 mW (GP)/4.93 mW (LP), resulting in an FOM of 41.0 fJ/step (GP)/47.5 fJ/step (LP). The supply voltage scalability is demonstrated down to 0.5 V (GP)/0.8 V (LP) and improves the FOM to 28.0 fJ/step (GP)/37.8 fJ/step (LP), while maintaining higher than 66 dB SNDR.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; charge exchange; energy conservation; ladder networks; low-power electronics; pipeline processing; power aware computing; switched capacitor networks; CMOS process; FOM; GP technology; LP technology; SNDR; ZCB circuit technique; ZCB pipelined ADC; digital implementation characteristics; energy efficient operation; flash resistor ladder scaling; general purpose technology; identical design file; low power technology; nominal supply; power 4.07 mW; power 4.93 mW; programmable ramp rates; size 65 nm; supply voltage range; supply voltage scalability; supply voltage scaling; unidirectional coarse-fine charge transfer scheme; voltage 0.5 V to 1.2 V; voltage scalable zero-crossing-based pipelined ADC; Accuracy; Capacitors; Charge transfer; Detectors; Noise; Power demand; Resistors; Analog-to-digital conversion (ADC); calibration; pipeline; scalability; switched-capacitor circuits; voltage scaling; zero-crossing; zero-crossing based circuits (ZCBC);
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2012.2191184