DocumentCode :
1521781
Title :
The Fast EPILE Combined With FBM for Electromagnetic Scattering From Dielectric Targets Above and Below the Dielectric Rough Surface
Author :
Yu Liang ; Li-Xin Guo ; Zhen-sen Wu
Author_Institution :
Sch. of Sci., Xidian Univ., Xi´an, China
Volume :
49
Issue :
10
fYear :
2011
Firstpage :
3892
Lastpage :
3905
Abstract :
The composite electromagnetic scattering from dielectric targets above and below the dielectric rough surface using the method of moments (MOM) and the Extended Propagation-Inside-Layer Expansion (EPILE) combined with the Forward-Backward method (FBM) is studied. The established integral equations are validated by comparing with the related theory. The efficiency and exactness of the EPILE+FBM are verified by comparing with the MOM. The influences from the target size, the target height/depth, the target horizontal distance, the relative permittivity, the rms height, as well as the correlation length to the bistatic scattering coefficient are also investigated. The presented scheme is of generality for the targets and rough surface composite scattering problems.
Keywords :
dielectric materials; electromagnetic wave propagation; electromagnetic wave scattering; integral equations; method of moments; permittivity; rough surfaces; EPILE; FBM; MOM; bistatic scattering coefficient; composite electromagnetic scattering; correlation length; dielectric rough surface; dielectric target; extended propagation-inside-layer expansion; forward-backward method; integral equation; method of moments; relative permittivity; rms height; target horizontal distance; target size; Computational complexity; Dielectrics; Electromagnetic scattering; Moment methods; Rough surfaces; Surface roughness; Dielectric rough surface (DRS); Extended Propagation-Inside-Layer Expansion (EPILE); dielectric targets; electromagnetic scattering; the forward-backward method (FBM); the method of moments (MOM);
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on
Publisher :
ieee
ISSN :
0196-2892
Type :
jour
DOI :
10.1109/TGRS.2011.2139219
Filename :
5771555
Link To Document :
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