• DocumentCode
    1522011
  • Title

    Accurate non-uniform transmission line model and its application to the de-embedding of on-wafer measurements

  • Author

    Young, P.R. ; McPherson, D.S. ; Chrisostomidis, C. ; Elgaid, K. ; Thayne, I.G. ; Lucyszyn, S. ; Robertson, I.D.

  • Author_Institution
    Electron. Eng. Labs., Kent Univ., Canterbury, UK
  • Volume
    148
  • Issue
    3
  • fYear
    2001
  • fDate
    6/1/2001 12:00:00 AM
  • Firstpage
    153
  • Lastpage
    156
  • Abstract
    An accurate model for lossy non-uniform transmission lines is presented. The technique provides a coplanar waveguide (CPW) taper model, which has been used to accurately de-embed measurements of passive CPW components in line geometries differing from the nominal 50Ω geometry of the calibration. The model accounts for both dielectric and conductor losses, and is shown to be in excellent agreement with measured results from 45 MHz to 120 GHz
  • Keywords
    MMIC; S-parameters; coplanar waveguides; integrated circuit measurement; transmission line theory; 45 MHz to 120 GHz; S-parameters; accurate model; conductor losses; coplanar waveguide taper model; dielectric losses; lossy nonuniform transmission lines; nonuniform transmission line model; on-wafer measurements de-embedding; passive CPW components;
  • fLanguage
    English
  • Journal_Title
    Microwaves, Antennas and Propagation, IEE Proceedings
  • Publisher
    iet
  • ISSN
    1350-2417
  • Type

    jour

  • DOI
    10.1049/ip-map:20010402
  • Filename
    942838