• DocumentCode
    1522163
  • Title

    Silicon-Controlled Rectifier Stacking Structure for High-Voltage ESD Protection Applications

  • Author

    Liu, Zhiwei ; Liou, Juin J. ; Dong, Shurong ; Han, Yan

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Univ. of Central Florida, Orlando, FL, USA
  • Volume
    31
  • Issue
    8
  • fYear
    2010
  • Firstpage
    845
  • Lastpage
    847
  • Abstract
    Latchup immunity is a challenging issue for the design of power supply clamps used in high-voltage electrostatic discharge (ESD) protection applications. While silicon-controlled rectifiers (SCRs) are highly robust ESD devices, they are traditionally not suited for high-voltage ESD due to their inherent low holding voltage and, thus, vulnerability to latchup. In this letter, a novel SCR stacking structure with an extremely high holding voltage, very small snapback, and acceptable failure current has been developed. The new and existing high holding voltage ESD devices are also compared to demonstrate the advancement of this work.
  • Keywords
    clamps; electrostatic discharge; thyristors; electrostatic discharge; high-voltage ESD protection; latchup immunity; power supply clamps; silicon-controlled rectifier stacking structure; Electrostatic discharge (ESD); high holding voltage; latchup; silicon-controlled rectifier (SCR);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2010.2050575
  • Filename
    5492172