• DocumentCode
    1522176
  • Title

    A Novel Tungsten–Nickel Alloy Ohmic Contact to SiC at 900 ^{\\circ}\\hbox {C}

  • Author

    Okojie, R.S. ; Evans, L.J. ; Lukco, D. ; Morris, J.P.

  • Author_Institution
    NASA Glenn Res. Center, Cleveland, OH, USA
  • Volume
    31
  • Issue
    8
  • fYear
    2010
  • Firstpage
    791
  • Lastpage
    793
  • Abstract
    A novel tungsten-nickel ohmic contact metallization on 4H-SiC and 6H-SiC capable of surviving temperatures as high as 900°C is reported. Preliminary results revealed the following: (1) ohmic contact on n-type 4H-SiC having net doping levels (Nd´s) of 1.4 and 2 × 1019 cm-3, with specific contact resistances ρsNd´s of 7.69 × 10-4 and 5.81 × 10-4 Ω · cm2, respectively, after rapid thermal annealing (RTA), and 5.9 × 10-3 and 2.51 × 10-4 Ω · cm2, respectively, after subsequent soak at 900°C for 1 h in argon, and (2) ohmic contact on n- and p-type 6H-SiC having Nd > 2 × 1019 and Nα > 1 × 1020 cm-3, with ρsNd = 5 × 10-5 and ρsNa = 2 × 10-4 Ω · cm2, respectively, after RTA, and ρSNd = 2.5 × 10-5 and ρSNa = 1.5 × 10-4 Ω · cm2 after subsequent treatment at 900°C for 1 h in argon, respectively.
  • Keywords
    argon; integrated circuit metallisation; nickel alloys; ohmic contacts; rapid thermal annealing; silicon compounds; tungsten alloys; wide band gap semiconductors; RTA; SiC; net doping levels; ohmic contact metallisation; rapid thermal annealing; specific contact resistances; temperature 900 degC; time 1 hr; Amphoteric; high temperature; nickel; ohmic contacts; silicon carbide; tungsten;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2010.2050761
  • Filename
    5492174