DocumentCode :
1522394
Title :
Exploiting symmetry when verifying transistor-level circuits by symbolic trajectory evaluation
Author :
Pandey, Manish ; Bryant, Randal E.
Author_Institution :
Res. Lab., IBM Corp., Austin, TX, USA
Volume :
18
Issue :
7
fYear :
1999
fDate :
7/1/1999 12:00:00 AM
Firstpage :
918
Lastpage :
935
Abstract :
We describe the use of symmetry for verification of transistor-level circuits by symbolic trajectory evaluation (STE). We present a new formulation of STE which allows a succinct description of symmetry properties in circuits, Symmetries in circuits are classified as structural symmetries, arising from similarities in circuit structure, data symmetries, arising from similarities in the handling of data values, and mixed structural-data symmetries. We use graph isomorphism testing and symbolic simulation to verify the symmetries in the original circuit, Using conservative approximations, we partition a circuit to expose the symmetries in its components, and construct reduced system models which can be verified efficiently, Introducing X-drivers into switch-level circuits simplifies the task of creating conservative approximations of switch-level circuits, Our empirical results show that exploiting symmetry with conservative approximations can allow one to verify systems several orders of magnitude larger than otherwise possible. We present results of verifying static random access memory circuits with up to 1.5 Million transistors,
Keywords :
SRAM chips; cellular arrays; formal verification; graph theory; logic partitioning; symbol manipulation; X-drivers; circuit partitioning; circuit structure; conservative approximations; data symmetries; graph isomorphism testing; memory arrays; mixed structural-data symmetries; reduced system models; static random access memory circuits; structural symmetries; switch-level circuits; symbolic simulation; symbolic trajectory evaluation; transistor-level circuits; Capacitance; Circuit simulation; Circuit testing; Computer science; Design optimization; Formal verification; Hardware; Random access memory; SRAM chips; Switching circuits;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.771176
Filename :
771176
Link To Document :
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